Photodetachment Microscope with Repulsive Coulomb Field

TL;DR

This paper explores how a repulsive Coulomb field enhances the interference pattern in photodetachment microscopy, proposing new theoretical models and experimental setups for high-resolution electronic imaging.

Contribution

It introduces a novel theoretical framework for analyzing photodetachment in a Coulomb field and demonstrates the magnification effect on interference patterns, enabling improved microscopy techniques.

Findings

Repulsive Coulomb field magnifies interference patterns.

Asymptotic interference patterns can be calculated using semiclassical approximation.

Proposes experimental parameters for observing the effect.

Abstract

Investigation of electronic waves with high coherence in photodetachment of a negative ion gives a physical basis to develop the holographic electronic microscopy with high resolution. The interference pattern is considered in the framework of steady-state wave approach. In semiclassical approximation, an outgoing wave is described by the amplitude slowly varying along a trajectory. Quantum description of electron photodetachment from negative ion is formulated with the help of the inhomogeneous Schr\"odinger equation. Its asymptotic solution is expressed in terms of the Green function that has exact expression for the homogeneous electric field and the Coulomb field. It is demonstrated that repulsive Coulomb field is effective for magnification of the interference pattern at a short distance from an ion. For the first time, as shown for this case, the interference pattern in asymptotic area can be calculated by means of global semiclassical approximation or, a little more roughly, by simple uniform field approximation. New proposals and possible parameters for experimental measurement scheme for the effect are discussed.