Bayesian Post-Processor and other Enhancements of Subset Simulation for Estimating Failure Probabilities in High Dimensions

TL;DR

This paper enhances Subset Simulation for estimating small failure probabilities in high-dimensional reliability problems by analyzing and optimizing the MCMC sampling process and introducing a Bayesian post-processor to quantify uncertainty.

Contribution

It introduces an optimal scaling strategy for the Modified Metropolis algorithm within SS and develops a Bayesian post-processor (SS+) that provides a full posterior distribution of failure probabilities.

Findings

Optimal scaling of MMA improves sampling efficiency.

The Bayesian SS+ yields a posterior PDF of failure probability.

The method quantifies uncertainty in failure probability estimates.

Abstract

Estimation of small failure probabilities is one of the most important and challenging computational problems in reliability engineering. The failure probability is usually given by an integral over a high-dimensional uncertain parameter space that is difficult to evaluate numerically. This paper focuses on enhancements to Subset Simulation (SS), proposed by Au and Beck, which provides an efficient algorithm based on MCMC (Markov chain Monte Carlo) simulation for computing small failure probabilities for general high-dimensional reliability problems. First, we analyze the Modified Metropolis algorithm (MMA), an MCMC technique, which is used in SS for sampling from high-dimensional conditional distributions. We present some observations on the optimal scaling of MMA, and develop an optimal scaling strategy for this algorithm when it is employed within SS. Next, we provide a theoretical basis for the optimal value of the conditional failure probability $p_0$, an important parameter one has to choose when using SS. Finally, a Bayesian post-processor SS+ for the original SS method is developed where the uncertain failure probability that one is estimating is modeled as a stochastic variable whose possible values belong to the unit interval. Simulated samples from SS are viewed as informative data relevant to the system's reliability. Instead of a single real number as an estimate, SS+ produces the posterior PDF of the failure probability, which takes into account both prior information and the information in the sampled data. This PDF quantifies the uncertainty in the value of the failure probability and it may be further used in risk analyses to incorporate this uncertainty. The relationship between the original SS and SS+ is also discussed