A near real-time framework for extracting tip-sample forces in dynamic atomic force microscopy (dAFM)
David Busch, Qingze Zou, Baskar Ganapathysubramanian

TL;DR
This paper introduces a GPU-accelerated, near real-time framework for estimating tip-sample forces in dynamic atomic force microscopy, enabling rapid force inversion during AFM operation to protect soft samples.
Contribution
It presents the first near real-time force inversion framework for dAFM using GPU acceleration and particle-swarm optimization, significantly speeding up calculations.
Findings
Achieved 30,000-fold speed-up with GPU-based forward solver
Performed force inversion in sub-second times
Demonstrated potential for real-time AFM imaging and characterization
Abstract
The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen causes cantilever deflections that are measured by an optical sensing mechanism and subsequently utilized to construct the sample topography. Recent years have seen increased interest in using the AFM to characterize soft specimens like gels and live cells. This remains challenging due to the complex and competing nature of tip-sample interaction forces - large tip-sample interaction force is necessary to achieve good signal-to-noise ratios; However, large force tends to deform and destroy soft samples. In situ estimation of the local tip-sample interaction force is needed to control the AFM cantilever motion and prevent destruction of soft samples…
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Taxonomy
TopicsForce Microscopy Techniques and Applications · Mechanical and Optical Resonators · Piezoelectric Actuators and Control
