Electron tomography at 2.4 {\AA} resolution
M. C. Scott, Chien-Chun Chen, Matthew Mecklenburg, Chun Zhu, Rui Xu,, Peter Ercius, Ulrich Dahmen, B. C. Regan, Jianwei Miao

TL;DR
This paper demonstrates a novel electron tomography method achieving 2.4 Å resolution, enabling atomic-scale 3D imaging of nanoparticles without prior structural assumptions, advancing nanomaterials characterization.
Contribution
The authors introduce a new projection alignment and reconstruction technique combined with STEM, achieving atomic resolution in 3D tomography without prior knowledge of sample structure.
Findings
Achieved 2.4 Å resolution in 3D nanoparticle imaging
Observed individual atoms and identified grain structures
Revealed the surface morphology and internal lattice of a gold nanoparticle
Abstract
Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial resolution and image quality in TEM have been significantly improved(4,5) and resolution below 0.5 {\AA} has been demonstrated(6). To reveal the 3D structure of thin samples, electron tomography is the method of choice(7-11), with resolutions of ~1 nm^3 currently achievable(10,11). Recently, discrete tomography has been used to generate a 3D atomic reconstruction of a silver nanoparticle 2-3 nm in diameter(12), but this statistical method assumes prior knowledge of the particle's lattice structure and requires that the atoms fit rigidly on that lattice. Here we report the experimental demonstration of a general electron tomography method that achieves atomic…
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