Voltage modulated electro-luminescence spectroscopy and negative capacitance - the role of sub-bandgap states in light emitting devices
Kanika Bansal, Shouvik Datta

TL;DR
This study investigates how sub-bandgap defect states influence electroluminescence and negative capacitance in light-emitting diodes, revealing their impact on device efficiency and carrier dynamics at high frequencies.
Contribution
It provides experimental evidence linking sub-bandgap states to negative capacitance and light emission behavior, highlighting their role in device performance.
Findings
Negative capacitance correlates with the onset of voltage modulated electroluminescence.
Sub-bandgap defect states participate actively in minority carrier recombination.
High-frequency operation can reduce external quantum efficiency due to these states.
Abstract
Voltage modulated electroluminescence spectra and low frequency ({\leq} 100 kHz) impedance characteristics of electroluminescent diodes are studied. Voltage modulated light emission tracks the onset of observed negative capacitance at a forward bias level for each modulation frequency. Active participation of sub-bandgap defect states in minority carrier recombination dynamics is sought to explain the results. Negative capacitance is understood as a necessary dielectric response to compensate any irreversible transient changes in the minority carrier reservoir due to radiative recombinations mediated by slowly responding sub-bandgap defects. Experimentally measured variations of the in-phase component of modulated electroluminescence spectra with forward bias levels and modulation frequencies support the dynamic influence of these states in the radiative recombination process.…
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