Second-generation microlensing planet surveys: a realistic simulation
Yossi Shvartzvald, Dan Maoz

TL;DR
This paper presents a realistic simulation of second-generation microlensing surveys, analyzing how observational parameters influence planet detection rates and estimating the survey's potential to determine planet occurrence frequencies.
Contribution
It introduces a detailed numerical simulation of microlensing surveys that accounts for various physical and observational parameters, providing insights into detection yields and parameter degeneracies.
Findings
Detection yield doubles when cadence improves from 3 hours to 15 minutes.
A 150-day experiment duration increases planet discoveries compared to 80 days.
The survey can measure snowline planet frequency with 10-30% precision after 4 years.
Abstract
Microlensing surveys, which have discovered about a dozen extrasolar planets to date, have focused on the small minority of high-magnification lensing events, which have a high sensitivity to planet detection. In contrast, second-generation experiments, of the type that has recently begun, monitor continuously also the majority of low-magnification events. We carry out a realistic numerical simulation of such experiments. We simulate scaled, solar-like, eight-planet systems, studying a variety of physical parameters (planet frequency, scaling of the snowline with stellar mass R_snow ~ M^s), and folding in the various observational parameters (cadence, experiment duration), with sampling sequences and photometric error distributions taken from the real ongoing experiment. We quantify the dependence of detected planet yield on cadence and experiment duration, e.g., the yield is doubled…
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