Quantitative methods for deconvolution of true topographical properties of object on the basis of AFM-images: Part 1. Contact tip-sample deformations
M. O. Gallyamov, I. V. Yaminsky

TL;DR
This paper develops a quantitative approach using Hertz contact theory to correct AFM measurements for contact deformations, enabling accurate determination of microobject elastic properties.
Contribution
It introduces a numerical solution and analytical approximations for contact deformations in AFM, improving the accuracy of topographical property measurements.
Findings
Theoretical models align with experimental data.
The approach allows elastic parameter determination of microobjects.
Analytical formulas are derived for cylindrical sample geometries.
Abstract
We assume that the sample height measured using AFM is reduced due to contact deformation. The Herz contact theory is applied for the quantitative description. General numerical solution is found. Analytical approximations for specific contact geometry are derived for the case of cylindrical sample. It is found that theoretical description are consistent with experimental data. The developed approach has allowed to determine elastic parameters of individual microobjects adsorbed on a surface of solid substrate.
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Taxonomy
TopicsAdhesion, Friction, and Surface Interactions · Force Microscopy Techniques and Applications · Surface Roughness and Optical Measurements
