Maximum entropy deconvolution of resonant inelastic x-ray scattering spectra

TL;DR

This paper demonstrates that the Maximum Entropy method effectively deconvolves RIXS spectra, enhancing feature resolution and interpretation without significantly amplifying noise, thereby advancing analysis of electronic structures.

Contribution

The study introduces the application of the Maximum Entropy technique to RIXS spectra deconvolution, improving spectral feature clarity in condensed matter research.

Findings

Maximum Entropy improves spectral resolution in RIXS data.

Deconvolution enhances interpretation of electronic loss features.

Noise amplification remains controlled during the process.

Abstract

Resonant inelastic x-ray scattering (RIXS) has become a powerful tool in the study of the electronic structure of condensed matter. Although the linewidths of many RIXS features are narrow, the experimental broadening can often hamper the identification of spectral features. Here, we show that the Maximum Entropy technique can successfully be applied in the deconvolution of RIXS spectra, improving the interpretation of the loss features without a severe increase in the noise ratio.