Spectrally narrow, long-term stable optical frequency reference based on a Eu$^{3+}$:Y$_{2}$SiO$_{5}$ crystal at cryogenic temperature

TL;DR

This study demonstrates a highly stable optical frequency reference using spectral hole burning in Eu$^{3+}$:Y$_{2}$SiO$_{5}$ at cryogenic temperatures, achieving narrow linewidths and minimal drift.

Contribution

It provides detailed characterization of spectral holes in Eu$^{3+}$:Y$_{2}$SiO$_{5}$ for ultra-stable laser frequency stabilization at cryogenic temperatures.

Findings

Spectral holes with linewidths as low as 6 kHz were observed.

The upper limit of the spectral hole drift was approximately 5±3 mHz/s.

The study discusses requirements for ultra-high-stability laser frequency locking.

Abstract

Using an ultrastable continuous-wave laser at 580 nm we performed spectral hole burning of Eu$^{3+}$:Y$_{2}$SiO$_{5}$ at very high spectral resolution. Essential parameters determining the usefulness as a "macroscopic" frequency reference: linewidth, temperature sensitivity, long-term stability were characterized, using a H-maser stabilized frequency comb. Spectral holes with linewidth as low as 6 kHz were observed and the upper limit of the drift of the hole frequency was determined to be on the order of 5$\pm$3 mHz/s. We discuss necessary requirements for achieving ultra-high-stability in laser frequency stabilization to these spectral holes.