Revealing the grain structure of graphene grown by chemical vapor deposition
P\'eter Nemes - Incze, Kwon Jae Yoo, Levente Tapaszt\'o, Gergely, Dobrik, J\'anos L\'ab\'ar, Zsolt E. Horv\'ath, Chanyong Hwang, L\'aszl\'o, P\'eter Bir\'o
TL;DR
This paper introduces a rapid, AFM-based method to visualize the grain structure of CVD-grown graphene by selectively oxidizing defects, providing a practical alternative to electron microscopy.
Contribution
It presents a novel, simple technique for revealing graphene's grain structure, enhancing quality assessment of CVD-grown graphene.
Findings
Effective visualization of grain boundaries using AFM after defect oxidation
Method offers quick feedback on graphene quality
Potential for widespread adoption in graphene research and production
Abstract
The physical processes occurring in the presence of disorder: point defects, grain boundaries, etc. may have detrimental effects on the electronic properties of graphene. Here we present an approach to reveal the grain structure of graphene by the selective oxidation of defects and subsequent atomic force microscopy analysis. This technique offers a quick and easy alternative to different electron microscopy and diffraction methods and may be used to give quick feedback on the quality of graphene samples grown by chemical vapor deposition.
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