Vector Reflectometry in a Beam Waveguide

TL;DR

This paper introduces a one-port calibration method using known delays for characterizing beam waveguide components with a vector network analyzer, demonstrated on a millimeter-wave polarization modulator.

Contribution

The paper presents a novel calibration technique that improves the measurement accuracy of beam waveguide components using a simple one-port setup.

Findings

Effective separation of instrument and device responses

Accurate measurement of millimeter-wave components

Demonstrated on a polarization modulator

Abstract

We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device under test. We demonstrate this technique by measuring the reflected performance of a millimeter-wave variable-delay polarization modulator.