Efficient Quasiparticle Evacuation in Superconducting Devices

TL;DR

This paper investigates how metallic trap junctions improve the removal of excess quasiparticles in superconducting devices by analyzing their spatial distribution and temperature effects.

Contribution

It provides a detailed quantitative analysis of quasiparticle diffusion and demonstrates the significant role of metallic traps in quasiparticle evacuation.

Findings

Metallic trap junctions significantly enhance quasiparticle evacuation.

Superconductor temperature measurements reveal the effectiveness of traps.

Quantitative spatial distribution of quasiparticles is characterized.

Abstract

We have studied the diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.