X-ray polarization: General formalism and polarization analysis

TL;DR

This paper develops a comprehensive mathematical framework for analyzing fully and partially polarized x-rays, enhancing techniques in magnetic and resonant scattering experiments to improve signal analysis and interpret scattering processes.

Contribution

It introduces a general formalism for x-ray polarization analysis applicable to various experimental setups and specific applications like linear polarization analysis and resonant scattering.

Findings

Framework enables detailed polarization analysis of x-ray beams.

Application to Ge K-edge scattering demonstrates practical utility.

Improves interpretation of magnetic and multipolar order signals.

Abstract

The polarization of x-rays plays an outstanding role in experimental techniques such as non-resonant magnetic x-ray scattering and resonant x-ray scattering of magnetic and multipolar order. Different instrumental methods applied to synchrotron light can transform its natural polarization into an arbitrary polarization state. Several synchrotron applications, in particular in the field of magnetic and resonant scattering rely on the improvement in the signal/noise ratio or the deeper insight into the ordered state and the scattering process made possible through these polarization techniques. Here, we present the mathematical framework for the description of fully and partially polarized x-rays, with some applications such as linear x-ray polarization analysis for the determination of the scattered beam's polarization, and the Ge K-edge resonant scattering.