A Simple Model to Measure Linewidth Enhancement Factor (\alpha) for Multi-wavelengths Semiconductor Laser

TL;DR

This paper introduces a simple, novel model for measuring the linewidth enhancement factor () in multi-wavelength semiconductor lasers, utilizing suppression characteristics during optical injection locking, demonstrated experimentally on a Fabry-Pe9rot laser.

Contribution

It proposes a new, straightforward method to measure  for individual modes in multi-wavelength lasers, especially with large mode spacing.

Findings

Successfully measured  of a laser mode experimentally.

Demonstrated the model's effectiveness on a slotted Fabry-Pe9rot laser.

Provides a practical approach for  measurement in complex laser systems.

Abstract

A novel and simple model is proposed for the measurement of the linewidth enhancement factor (LEF) {\alpha} of multiwavelengths semiconductor laser. It is based on the suppression characteristics of an arbitrary mode while other modes are optically injection locked individually. The proposed model can be used to measure {\alpha} value of individual modes of multi-wavelengths laser with large mode spacing. As a proof of the concept, the model is used to experimentally measure {\alpha} of a mode of a slotted Fabry- P\'erot laser source.