MxTiSe2 (M = Cr, Mn, Cu) electronic structure study by methods of resonant X-ray photoemission spectroscopy and X-Ray absorption spectroscopy
A.S.Shkvarin, Yu.M.Yarmoshenko, M.V.Yablonskikh, N.A.Skorikov,, A.I.Merentsov, A.N.Titov

TL;DR
This study investigates the electronic structure and chemical bonding in MxTiSe2 compounds using resonant X-ray photoemission and absorption spectroscopy, revealing charge transfer and narrow d-bands near the Fermi level.
Contribution
It provides detailed insights into the electronic structure and chemical bonding in MxTiSe2 compounds, highlighting the effects of different transition metal intercalations.
Findings
Charge transfer from intercalated atoms to Ti 3d band detected.
Narrow Ti 3d and Cu 3d bands observed near Fermi level.
Spectroscopy methods are highly sensitive to chemical bonding.
Abstract
Electronic structure and chemical bonding in TiX2 (X=S, Se, Te), TMxTiSe2 (TM=Cr, Mn, Cu) and CrxTi1-xSe2 were studied by x-ray resonance photoemission and absorption spectroscopy. These methods are detected to be strong sensitive to chemical bonding. Charge transfer from the intercalated atoms to Ti 3d band is detected. Narrow Ti 3d and Cu 3d bands are observed under Fermi level in CuxTiSe2.
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