Comprehensive characterization of an individual carbon nanotube transport device

TL;DR

This paper introduces a comprehensive approach combining microscopy, spectroscopy, and electrical measurements to analyze individual carbon nanotube devices, revealing correlations between structural properties and transport behavior.

Contribution

It presents a novel sample design enabling simultaneous multi-modal characterization of single nanotube devices, enhancing understanding of their transport properties.

Findings

Correlations between Raman shifts and contact interface properties

Structural features influence electrical transport behavior

Integrated methodology improves device analysis accuracy

Abstract

We present a comprehensive characterization of an individual multiwalled carbon nanotube transport device combining electron microscopy and Raman spectroscopy with electrical measurements. Each method gives complementary information that mutually help to interpret each other. A sample design that allows for combining these investigation methods on individual carbon nanotube devices is introduced. This offers a direct correlation of transport features and shifts of Raman modes with structural properties as e.g. the contact interface and the morphology of the nanotube.