An in-vacuum diffractometer for resonant elastic soft x-ray scattering
D. G. Hawthorn, F. He, L. Venema, H. Davis, A. J. Achkar, J. Zhang, R., Sutarto, H. Wadati, A. Radi, T. Wilson, G. Wright, K. M. Shen, J. Geck, H., Zhang, V. Novak, G. A. Sawatzky

TL;DR
This paper presents a detailed design and performance analysis of a specialized in-vacuum diffractometer for resonant elastic soft x-ray scattering, capable of high-precision measurements at ultra-high vacuum and low temperatures.
Contribution
It introduces a novel 4-circle in-vacuum diffractometer with multiple detectors and ultra-high vacuum operation, tailored for soft x-ray scattering studies.
Findings
Successfully measured diffraction and reflectivity in complex materials.
Achieved operation at 18 K with ultra-high vacuum conditions.
Demonstrated versatility with multiple detectors for various signal strengths.
Abstract
We describe the design, construction and performance of a 4-circle in-vacuum diffractometer for resonant elastic soft x-ray scattering and reflectivity. The diffractometer, installed on the REIXS beamline at the Canadian Light Source, includes 9 in-vacuum motions driven by in-vacuum stepper motors and operates in ultra-high vacuum at base pressure of 2 x10^-10 Torr. Cooling to a base temperature of 18 K is provided with a closed-cycle cryostat. The diffractometer includes a choice of 3 photon detectors: a photodiode, a channeltron and a 2D sensitive channelplate detector. Along with variable slit and filter options, these detectors are suitable for studying a wide range of phenomena having both weak and strong diffraction signals. Example measurements of diffraction and reflectivity in Nd-doped (La,Sr)_2CuO_4 and thin film (Ga,Mn)As are shown.
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