Large-scale electronic structure calculations of vacancies in 4H-SiC using the Heyd-Scuseria-Ernzerhof screened hybrid density functional
Tamas Hornos, Adam Gali, Bengt G. Svensson

TL;DR
This study employs large-scale hybrid density functional calculations to accurately analyze vacancies in 4H-SiC, revealing the carbon vacancy as the likely cause of specific defect centers.
Contribution
It introduces a large-scale, gap error free computational approach using HSE06 functional for vacancy analysis in 4H-SiC, linking defects to experimental centers.
Findings
Carbon vacancy likely causes Z1/2 and EH6/7 DLTS centers
Utilizes hybrid density functional for precise electronic structure calculations
Provides a charge correction scheme for large-scale defect modeling
Abstract
Large-scale and gap error free calculations of the electronic structure of vacancies in 4H-SiC have been carried out using a hybrid density functional (HSE06) and an accurate charge correction scheme. Based on the results the carbon vacancy is proposed to be responsible for the Z1/2 and EH6/7 DLTS centers
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Taxonomy
TopicsSilicon Carbide Semiconductor Technologies · Copper Interconnects and Reliability · Semiconductor materials and devices
