Quantum spatial superresolution by optical centroid measurements

TL;DR

This paper introduces an improved optical centroid measurement technique using photon-number-resolving detection to achieve quantum superresolution with higher efficiency than traditional quantum lithography methods.

Contribution

It presents a novel variation of the optical centroid measurement method that enhances detection efficiency for quantum superresolution imaging.

Findings

Demonstrated superresolution with higher detection efficiency

Laboratory results for two-photon interference

Comparison shows improved performance over standard quantum lithography

Abstract

Quantum lithography (QL) has been suggested as a means of achieving enhanced spatial resolution for optical imaging, but its realization has been held back by the low multi-photon detection rates of recording materials. Recently, an optical centroid measurement (OCM) procedure was proposed as a way to obtain spatial resolution enhancement identical to that of QL but with higher detection efficiency (M. Tsang, Phys. Rev. Lett. 102, 253601, 2009). Here we describe a variation of the OCM method with still higher detection efficiency based on the use of photon-number-resolving detection. We also report laboratory results for two-photon interference. We compare these results with those of the standard QL method based on multi-photon detection and show that the new method leads to superresolution but with higher detection efficiency.