Study of noise effects in electrical impedance tomography with resistor networks
Liliana Borcea, Fernando Guevara Vasquez, Alexander V. Mamonov

TL;DR
This paper investigates how noise impacts the accuracy of electrical impedance tomography reconstructions using resistor network models and optimal grid parametrizations, highlighting the efficiency of these methods under various noise levels.
Contribution
It provides a numerical analysis of noise effects on EIT inversion with resistor networks and optimal grids, demonstrating their superior performance over other parametrizations.
Findings
Optimal grid parametrization yields the smallest estimation variance.
Estimates are unbiased and near the Cramer-Rao bound for small noise.
Regularization balances variance reduction and bias introduction for larger noise.
Abstract
We present a study of the numerical solution of the two dimensional electrical impedance tomography problem, with noisy measurements of the Dirichlet to Neumann map. The inversion uses parametrizations of the conductivity on optimal grids. The grids are optimal in the sense that finite volume discretizations on them give spectrally accurate approximations of the Dirichlet to Neumann map. The approximations are Dirichlet to Neumann maps of special resistor networks, that are uniquely recoverable from the measurements. Inversion on optimal grids has been proposed and analyzed recently, but the study of noise effects on the inversion has not been carried out. In this paper we present a numerical study of both the linearized and the nonlinear inverse problem. We take three different parametrizations of the unknown conductivity, with the same number of degrees of freedom. We obtain that the…
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