Refractive index spectral dependence, Raman and transmission spectra of high-purity $^{28}$Si, $^{29}$Si, $^{30}$Si, and $^{nat}$Si single crystals

TL;DR

This study provides precise measurements of the refractive index, Raman, and transmission spectra of high-purity silicon isotopes, revealing spectral dependencies and impurity effects across a broad wavelength range.

Contribution

It presents the first comprehensive spectral analysis of high-purity silicon isotopes with detailed refractive index data and dispersion modeling from 1.06 to over 80 micrometers.

Findings

Refractive index varies with isotope and phonon absorption regions.

Dispersion coefficients accurately fit experimental data.

Spectral features correlate with impurity levels and isotope composition.

Abstract

Precise measurement of the refractive index of stable silicon isotopes $^{28}$Si, $^{29}$Si, $^{30}$Si single crystals with enrichments above 99.9 at.% and a silicon single crystal $^{nat}$Si of natural isotopic composition is performed with the Fourier-transform interference refractometry method from 1.06 to more than 80 mkm with 0.1 cm$^{-1}$ resolution and accuracy of $2 \times 10^{-5} ... 1 \times 10^{-4}$. The oxygen and carbon concentrations in all crystals are within $5 \times 10^{15}$ cm$^{-3}$ and the content of metal impurities is $10^{-5} ... 10^{-6}$ at.%. The peculiar changes of the refractive index in the phonon absorption region of all silicon single crystals are shown. The coefficients of generalized Cauchy dispersion function approximating the experimental refractive index values all over the measuring range are given. The transmission and Raman spectra are also studied.