A comparsion of force sensors for atomic force microscopy based on quartz tuning forks and length extensional resonators
Franz J. Giessibl, Florian Pielmeier, Toyoaki Eguchi, Toshu An and, Yukio Hasegawa

TL;DR
This paper compares quartz-based force sensors for atomic force microscopy, analyzing their noise characteristics and performance factors to optimize sensor design and improve measurement accuracy.
Contribution
It provides a detailed calculation and measurement of noise sources in quartz sensors, offering insights into optimizing sensor stiffness, bandwidth, and amplitude for better AFM performance.
Findings
Deflection detector noise is independent of sensor stiffness.
Thermal, oscillator, and thermal drift noises increase with sensor stiffness.
Optimal signal-to-noise ratio depends on amplitude, bandwidth, and noise contributions.
Abstract
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These self sensing force sensors allow a relatively easy upgrade of a scanning tunneling microscope to a combined scanning tunneling/atomic force microscope. Two fundamentally different types of quartz sensors have achieved atomic resolution: the 'needle sensor' that is based on a length extensional resonator and the 'qPlus sensor' that is based on a tuning fork. Here, we calculate and measure the noise characteristics of these sensors. We find four noise sources: deflection detector noise, thermal noise, oscillator noise and thermal drift noise. We calculate the effect of these noise sources as a factor of sensor stiffness, bandwidth and oscillation…
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