Concept for controlled transverse emittance transfer within a linac ion beam

TL;DR

This paper proposes a new method for controlled transverse emittance transfer in ion beams, enhancing injection efficiency into circular accelerators by creating flat beams through charge state stripping, supported by multi-particle simulation results.

Contribution

The paper introduces a novel technique for emittance transfer in ion beams that does not require ECR source generation, extending flat beam production methods.

Findings

Method successfully transfers emittance between transverse planes.

Simulation results confirm the method's effectiveness.

Potential for improved injection efficiency in accelerators.

Abstract

For injection of beams into circular machines with different horizontal and vertical emittance acceptance, the injection efficiency can be increased if these beams are flat, i.e. if they feature unequal transverse emittances. Generation of flat electron beams is well known and has been demonstrated already in beam experiments. It was proposed also for ion beams that were generated in an Electron Cyclotron-Resonance (ECR) source. We introduce an extension of the method to beams that underwent charge state stripping without requiring their generation inside an ECR source. Results from multi-particle simulations are presented to demonstrate the validity of the method.