Tunneling characteristics of graphene
Young Jun Shin, Gopinadhan Kalon, Jaesung Son, Jae Hyun Kwon, Jing, Niu, Charanjit S. Bhatia, Gengchiau Liang, and Hyunsoo Yang

TL;DR
This paper investigates the tunneling behavior and negative differential conductance in graphene devices, revealing effects of electric breakdown and structural transformation, and demonstrates a high ON/OFF memory switching ratio.
Contribution
It provides new insights into the tunneling characteristics of graphene under high electric fields and introduces a memory switching effect with a 100000% ON/OFF ratio.
Findings
Negative differential conductance observed before breakdown
Tunneling barrier formation due to structural transformation
Memory switching effect with 100000% ON/OFF ratio
Abstract
Negative differential conductance and tunneling characteristics of two-terminal graphene devices are observed before and after electric breakdown, respectively. The former is caused by the strong scattering under a high E-field, and the latter is due to the appearance of a tunneling barrier in graphene channel induced by a structural transformation from crystalline graphene to disordered graphene because of the breakdown. Using Raman spectroscopy and imaging, the presence of non-uniform disordered graphene is confirmed. A memory switching effect of 100000% ON/OFF ratio is demonstrated in the tunneling regime which can be employed in various applications.
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