Characterisation of a Pixel Sensor in 0.20 micron SOI Technology for Charged Particle Tracking

TL;DR

This paper characterizes a 0.2 micron SOI pixel sensor for charged particle tracking, evaluating charge collection, efficiency, and resolution through laser, X-ray, and pion tests.

Contribution

It introduces a pixel sensor in 0.2 micron SOI technology with various pixel layouts optimized for charge collection, and provides comprehensive performance evaluation.

Findings

High charge collection efficiency demonstrated

Effective particle detection with high resolution

Sensor shows promising performance for charged particle tracking

Abstract

This paper presents the results of the characterisation of a pixel sensor manufactured in OKI 0.2 micron SOI technology integrated on a high-resistivity substrate, and featuring several pixel cell layouts for charge collection optimisation. The sensor is tested with short IR laser pulses, X-rays and 200 GeV pions. We report results on charge collection, particle detection efficiency and single point resolution.