Subcritical percolation with a line of defects
S. Friedli, D. Ioffe, Y. Velenik

TL;DR
This paper investigates how a line of defects affects the decay rate of connectivity probabilities in subcritical percolation on dimensional lattices, revealing phase transitions and exponential asymptotics.
Contribution
It provides the first rigorous analysis of pinning phenomena in percolation models beyond effective theories and exact calculations.
Findings
Existence of a critical defect probability p'_c where decay rates change
For dimensions 2 and 3, p'_c equals the base percolation threshold p
For dimensions 4 and higher, p'_c exceeds p
Abstract
We consider the Bernoulli bond percolation process on the nearest-neighbor edges of , which are open independently with probability , except for those lying on the first coordinate axis, for which this probability is . Define \[\xi_{p,p'}:=-\lim_{n\to\infty}n^{-1}\log \mathbb{P}_{p,p'}(0\leftrightarrow n\mathbf {e}_1)\] and . We show that there exists such that if and if . Moreover, , and for . We also analyze the behavior of as in dimensions . Finally, we prove that when , the following purely exponential asymptotics holds: \[\mathbb {P}_{p,p'}(0\leftrightarrow n\mathbf {e}_1)=\psi_de^{-\xi_{p,p'}n}\bigl(1+o(1)\bigr)\] for some constant…
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