Comparison of Error Estimations by DERs in One-Port S and SLO Calibrated VNA Measurements and Application
Nikolitsa Yannopoulou, Petros Zimourtopoulos

TL;DR
This paper compares error estimation methods in VNA measurements using DERs after two calibration techniques, demonstrating that quick calibration can encompass most errors identified by full calibration in practical antenna testing.
Contribution
It presents a systematic comparison of DER-based error estimations for quick and full calibration methods in VNA measurements, highlighting practical equivalences.
Findings
Quick calibration's error stripe includes nearly all errors from full calibration.
DERs effectively visualize systematic errors in VNA measurements.
Practical cases show quick calibration's adequacy for error estimation.
Abstract
In order to demonstrate the usefulness of the only one existing method for systematic error estimations in VNA (Vector Network Analyzer) measurements by using complex DERs (Differential Error Regions), we compare one-port VNA measurements after the two well-known calibration techniques: the quick reflection response, that uses only a single S (Short circuit) standard, and the time-consuming full one-port, that uses a triple of SLO standards (Short circuit, matching Load, Open circuit). For both calibration techniques, the comparison concerns: (a) a 3D geometric representation of the difference between VNA readings and measurements, and (b) a number of presentation figures for the DERs and their polar DEIs (Differential Error Intervals) of the reflection coefficient, as well as, the DERs and their rectangular DEIs of the corresponding input impedance. In this paper, we present the…
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Taxonomy
TopicsElectromagnetic Compatibility and Measurements · Microwave and Dielectric Measurement Techniques · Radio Frequency Integrated Circuit Design
