Field emission from single and few-layer graphene flakes

TL;DR

This study demonstrates stable field emission from single- and few-layer graphene flakes on SiO2/Si substrates, with currents up to 1 μA at moderate electric fields, modeled effectively by Fowler-Nordheim theory.

Contribution

It provides the first detailed characterization of field emission from individual graphene flakes using nanoprobes in an SEM environment.

Findings

Field emission currents up to 1 μA achieved

Emission process remains stable over hours

Fowler-Nordheim model accurately describes the emission

Abstract

We report the observation and characterization of field emission current from individual single- and few-layer graphene flakes laid on a flat SiO2/Si substrate. Measurements were performed in a scanning electron microscope chamber equipped with nanoprobes, used as electrodes to realize local measurements of the field emission current. We achieved field emission currents up to 1 {\mu}A from the flat part of graphene flakes at applied fields of few hundred V/{\mu}m. We found that emission process is stable over a period of several hours and that it is well described by a Fowler-Nordheim model for currents over 5 orders of magnitude.