A system and methodologies for absolute QE measurements from the vacuum ultraviolet through the NIR
Blake C. Jacquot, Steve P. Monacos, Michael E. Hoenk, Frank Greer,, Todd J. Jones, Shouleh Nikzad

TL;DR
This paper introduces a system and methodology for precise absolute quantum efficiency measurements across a broad spectrum from vacuum ultraviolet to near-infrared, validated using delta-doped silicon CCDs.
Contribution
It presents a novel system design and methodology for absolute QE measurements in the VUV range, addressing the unique challenges of such measurements.
Findings
Successful validation with delta-doped silicon CCDs
Demonstrated measurement accuracy in VUV range
Established protocols for handling and vacuum conditions
Abstract
In this paper we present our system design and methodology for making absolute quantum efficiency (QE) measurements through the vacuum ultraviolet (VUV) and verify the system with delta-doped silicon CCDs. Delta-doped detectors provide an excellent platform to validate measurements through the VUV due to their enhanced UV response. The requirements for measuring QE through the VUV are more strenuous than measurements in the near UV and necessitate, among other things, the use of a vacuum monochromator, good dewar chamber vacuum to prevent on-chip condensation, and more stringent handling requirements.
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