Relative stability of $6H$-SiC$\{0001\}$ surface terminations and formation of graphene overlayers by Si evaporation
Jochen Rohrer, Eleni Ziambaras, Per Hyldgaard

TL;DR
This study uses DFT calculations to analyze the stability of 6H-SiC surfaces and the formation of graphene overlayers via Si evaporation, revealing different bonding types and electronic effects depending on surface orientation.
Contribution
It provides a detailed comparison of surface stabilities and predicts the nature of graphene overlayers formed on different SiC surface terminations.
Findings
Different surface orientations favor distinct graphene bonding types.
A highly strained, chemically bonded overlayer forms on (0001).
A vdW bonded overlayer is preferred on (000\bar1) with doping effects.
Abstract
We present density functional theory (DFT) calculations for 6H-SiC surfaces with different surface stackings and terminations. We compare the relative stability of different and surfaces in terms of their surface free energies. Removing surface and subsurface Si atoms, we simulate the formation of graphene and graphene-like overlayers by Si evaporation. We find that overlayers with a different nature of bonding are preferred at the two non-equivalent surface orientations. At , a chemically bonded, highly strained and buckled film is predicted. At , a van der Waals (vdW) bonded overlayer is preferred. We quantify the vdW binding and show that it can have a doping effect on electron behavior in the overlayer.
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Taxonomy
TopicsSilicon Carbide Semiconductor Technologies · Graphene research and applications · Diamond and Carbon-based Materials Research
