Ultralow-frequency spontaneous oscillations of the current in polycrystalline silicon
V.A. Dorosinets, N.A. Poklonski, V.A. Samuilov, V.F. Stel'makh
TL;DR
This paper presents an experimental study of ultralow-frequency spontaneous current oscillations in polycrystalline silicon films under strong electric fields at room temperature, revealing new insights into their dynamic behavior.
Contribution
It provides the first detailed experimental analysis of ultralow-frequency current oscillations in polycrystalline silicon under high electric fields.
Findings
Identification of ultralow-frequency current oscillations
Observation of oscillations under strong electric fields at room temperature
Insights into the dynamic behavior of polycrystalline silicon
Abstract
We report results of experimental study of ultralow-frequency spontaneous oscillations of the current in polycrystalline silicon films subjected to strong electric fields at room temperature.
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Taxonomy
TopicsSilicon Nanostructures and Photoluminescence · Thin-Film Transistor Technologies · Mechanical and Optical Resonators