Time-bin entanglement of quasi-particles in semiconductor devices

TL;DR

This paper introduces a method to generate and detect time-bin entangled electron-hole pairs in semiconductor devices using high-frequency single-electron emission and interferometry, demonstrating quantum entanglement.

Contribution

It presents a novel scheme for creating and measuring time-bin entanglement of quasi-particles in semiconductor quantum dots, enabling new quantum information applications.

Findings

Violation of CHSH inequality demonstrated

Entanglement detected via current cross-correlations

Scheme feasible with existing quantum dot technology

Abstract

We propose a scheme to produce time bin entangled pairs of electrons and holes based on high frequency time-resolved single electron emission from a quantum dot coupled to 1D chiral channels. At first order in the tunneling rate, an electron-hole pair is emitted in a coherent superposition state of different time bins that violates a CHSH inequality. in our scheme entanglement can be detected by means of a Franson interferometer in which the electron and the hole are sent towards different Mach-Zehnder interferometers. An analysis of current cross-correlations allows to detect violations of the CHSH inequality.