Analysis of Shot Noise at Finite Temperatures in Fractional Quantum Hall Edge States

TL;DR

This paper studies how finite temperature affects shot noise in fractional quantum Hall edge states, revealing peak structures in the Fano factor that help distinguish quasi-particle statistics and propose methods to measure statistical angles.

Contribution

It introduces a novel analysis of shot noise at finite temperatures in FQH states, enabling probing of quasi-particle statistics and indirect measurement of statistical angles.

Findings

Peak structures in Fano factor at specific bias voltages.

Thermal fluctuations weaken quasi-particle binding.

Method to infer statistical angles in hierarchical FQH states.

Abstract

We investigate shot noise at {\it finite temperatures} induced by the quasi-particle tunneling between fractional quantum Hall (FQH) edge states. The resulting Fano factor has the peak structure at a certain bias voltage. Such a structure indicates that quasi-particles are weakly {\it glued} due to thermal fluctuation. We show that the effect makes it possible to probe the difference of statistics between $\nu=1/5,{}2/5$ FQH states where quasi-particles have the same unit charge.Finally we propose a way to indirectly obtain statistical angle in hierarchical FQH states.