Absorption Imaging of Ultracold Atoms on Atom Chips
David A. Smith (1), Simon Aigner (2), Sebastian Hofferberth (2,3),, Michael Gring (1), Mauritz Andersson (2,4), Stefan Wildermuth (2), Peter, Kr\"uger (2,5), Stephan Schneider (1), Thorsten Schumm (1), J\"org, Schmiedmayer (1,2) ((1) Vienna Center for Quantum Science, Technology
TL;DR
This paper discusses techniques for high-resolution imaging of ultracold atoms near surfaces on atom chips, emphasizing methods to measure atom-surface distance crucial for magnetic and surface-interaction studies.
Contribution
It introduces methods to accurately measure atom-surface distance during imaging, enhancing the analysis of atom-surface interactions on atom chips.
Findings
Effective imaging techniques near surfaces
Methods for precise atom-surface distance measurement
Improved analysis of atom-surface interactions
Abstract
Imaging ultracold atomic gases close to surfaces is an important tool for the detailed analysis of experiments carried out using atom chips. We describe the critical factors that need be considered, especially when the imaging beam is purposely reflected from the surface. In particular we present methods to measure the atom-surface distance, which is a prerequisite for magnetic field imaging and studies of atom surface-interactions.
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