Addendum to "Anomalous scaling and super-roughness in the growth of CdTe polycrystalline films"
F\'abio S. Nascimento, Ang\'elica S. Mata, Silvio C. Ferreira, Sukarno, O. Ferreira

TL;DR
This paper clarifies the distinction between long and short wavelength coarsening exponents in the growth of CdTe films, correcting previous interpretations and aligning short wavelength results with dynamical scaling theory.
Contribution
It demonstrates that the correlation lengths previously used do not represent the dynamical exponent and reconciles short wavelength exponents with established dynamical scaling theory.
Findings
Correlation lengths do not correspond to the dynamical exponent z.
Short wavelength coarsening exponent matches the dynamical scaling theory.
Clarification of scaling analysis in CdTe film growth.
Abstract
The scaling of the growth of CdTe films on glass substrates was investigated by Mata \textit{et al.} [Phys. Rev. B \textbf{78}, 115305 (2008)]. Part of the analysis consisted of the estimation of the correlation length using the decay in the height-height correlation function. Afterwards, the dynamical exponent was determined using the scaling hypothesis . In this Addendum, we show that the correlation lengths obtained by Mata \textit{et al.} provide a long wavelength coarsening exponent that does not correspond to the dynamical exponent . We also show that the short wavelength coarsening exponent is consistent with the exponent obtained by Nascimento \textit{et al}. [arXiv:1101.1493] via generic dynamical scaling theory.
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Taxonomy
TopicsAdvanced Semiconductor Detectors and Materials · Chalcogenide Semiconductor Thin Films
