Interaction of the Electromagnetic p-Wave with Thin Metal Film in the Field of Resonant Frequencies

TL;DR

This paper analytically investigates how thin metallic films interact with electromagnetic p-waves at resonant frequencies, analyzing transmission, reflection, and absorption dependencies, and proposes a method to determine film thickness contactlessly.

Contribution

It provides an analytical solution for thin metallic films at resonant frequencies and introduces a formula for contactless thickness measurement based on observable resonant frequencies.

Findings

Dependence of optical coefficients on film parameters is characterized.

Resonant frequency analysis enables contactless thickness determination.

Analytical solutions are derived for films not exceeding skin depth.

Abstract

It is shown that for thin metallic films thickness of which does not exceed thickness of skin layer, the problem allows analytical solution. In the field of resonant frequencies the analysis of dependence of coefficients of transmission, reflection and absorbtion on an electromagnetic wave is carried out. Dependence on pitch angle, thickness of the layer and coefficient of specular reflection and on effective electron collision frequency is carried out. The formula for contactless determination (calculation) of a thickness of a film by observable resonant frequencies is deduced.