X-ray reflected spectra from accretion disk models.II. Diagnostic tools for X-ray observations

TL;DR

This paper develops detailed models of X-ray reflection spectra from accretion disks, analyzing how ionization and composition affect observable features like iron K lines, aiding interpretation of X-ray observations.

Contribution

It introduces comprehensive reflection models with updated atomic data, covering a range of ionization states and spectral features for X-ray diagnostics.

Findings

Maximum Fe Kα EW of ~800 eV at log ξ ~ 1.5

EW decreases monotonically with increasing ionization parameter

Reflection features include broad continua and multiple emission lines

Abstract

We present a comprehensive study of the emission spectra from accreting sources. We use our new reflection code to compute the reflected spectra from an accretion disk illuminated by X-rays. This set of models covers different values of ionization parameter, solar iron abundance and photon index for the illuminating spectrum. These models also include the most complete and recent atomic data for the inner-shell of the iron and oxygen isonuclear sequences. We concentrate our analysis to the 2-10 keV energy region, and in particular to the iron K-shell emission lines. We show the dependency of the equivalent width (EW) of the Fe K$\alpha$ with the ionization parameter. The maximum value of the EW is $\sim 800$ eV for models with log $\xi\sim 1.5$, and decreases monotonically as $\xi$ increases. For lower values of $\xi$ the Fe K$\alpha$ EW decreases to a minimum near log $\xi\sim 0.8$. We produce simulated CCD observations based on our reflection models. For low ionized, reflection dominated cases, the 2-10 keV energy region shows a very broad, curving continuum that cannot be represented by a simple power-law. We show that in addition to the Fe K-shell emission, there are other prominent features such as the Si and S L$\alpha$ lines, a blend of Ar {\sc viii-xi} lines, and the Ca {\sc x} K$\alpha$ line. In some cases the S {\sc xv} blends with the He-like Si RRC producing a broad feature that cannot be reproduced by a simple Gaussian profile. This could be used as a signature of reflection.