Verifying entanglement in the Hong-Ou-Mandel dip
Megan R. Ray, Steven J. van Enk
TL;DR
This paper introduces a practical method to verify entanglement in the Hong-Ou-Mandel dip using inverse interference, accounting for real-world imperfections with linear optics and photodetectors.
Contribution
It proposes a novel entanglement detection technique based on inverse Hong-Ou-Mandel interference that is robust to experimental noise and imperfections.
Findings
Provides a lower bound on entanglement using linear optics and photodetectors.
Accounts for vacuum, multi-photon contamination, and phase noise.
Enables practical verification of entanglement in quantum optics experiments.
Abstract
The Hong-Ou-Mandel interference dip is caused by an entangled state, a delocalized bi-photon state. We propose a method of detecting this entanglement by utilizing inverse Hong-Ou-Mandel interference, while taking into account vacuum and multi-photon contaminations, phase noise, and other imperfections. The method uses just linear optics and photodetectors, and for single-mode photodetectors we find a lower bound on the amount of entanglement.
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