Structural and magnetic properties of Co2MnSi thin films

TL;DR

This study investigates the structural and magnetic properties of Co2MnSi thin films of various thicknesses grown on sapphire substrates, revealing detailed magnetic anisotropy and resonance characteristics.

Contribution

It provides new insights into the magnetic anisotropy and resonance behavior of Co2MnSi thin films with different thicknesses, using comprehensive X-ray diffraction and ferromagnetic resonance analysis.

Findings

Cubic <110> CSM axis is normal to substrate

In-plane anisotropy shows two-fold and four-fold symmetry

Magnetic parameters derived include magnetization and exchange stiffness

Abstract

Co2MnSi (CMS) films of different thicknesses (20, 50 and 100 nm) were grown by radio frequency (RF) sputtering on a-plane sapphire substrates. Our X-rays diffraction study shows that, in all the samples, the cubic <110> CSM axis is normal to the substrate and that there exist well defined preferential in-plane orientations. Static and dynamic magnetic properties were investigated using vibrating sample magnetometry (VSM) and micro-strip line ferromagnetic resonance (MS-FMR), respectively. From the resonance measurements versus the direction and the amplitude of an applied magnetic field we derive most of the magnetic parameters: magnetization, gyromagnetic factor, exchange stiffness coefficient and magnetic anisotropy terms. The in-plane anisotropy can be described as resulting from the superposition of two terms showing a two-fold and a four-fold symmetry without necessarily identical principal axes. The observed behavior of the hysteresis loops is in agreement with this complex form of the in-plane anisotropy