Observation of novel interference patterns in Bi2-xFexTe3+d by Fourier transform scanning tunneling spectroscopy
Y. Okada, C. Dhital, Wen-Wen Zhou, Hsin Lin, S. Basak, A. Bansil, Y., -B. Huang, H. Ding, Z. Wang, Stephen D. Wilson, V. Madhavan

TL;DR
This study uses Fourier transform scanning tunneling spectroscopy to observe novel magnetic impurity-induced backscattering in a magnetically doped topological insulator, revealing new electronic scattering channels linked to spin-flip processes.
Contribution
It provides the first spatial and momentum resolved evidence of magnetic impurity induced backscattering in a topological insulator, combining FT-STS with ARPES data.
Findings
Observation of a new backscattering channel along surface q-vector 9a.
Identification of spin-flip scattering as the origin of enhanced q-vectors.
First momentum-resolved measurement of magnetic impurity effects in a TI.
Abstract
In topological insulators (TI), strong spin-orbit coupling results in non-trivial scattering processes of the surface states, whose effects include suppressed back scattering1, 2, 3, 4 weak anti-localization5, 6 and the possibility of an exotic Kondo effect that mimics graphene7. Introducing time reversal breaking perturbations and establishing long-range magnetic order has been theorized to lead to the formation of quantized magnetoelectric phenomena8, fractionalized charge excitations, and the appearance of quantum wire states9. A key, elusive, step in exploring these and other novel electronic phases is the experimental observation of charge backscattering due to spin-flip processes at the surface of a magnetically-doped TI. Here we utilize Fourier transform scanning tunneling spectroscopy (FT-STS) to probe the surface of a magnetically doped TI, Bi2-xFexTe3+d. Our measurements show…
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Taxonomy
TopicsTopological Materials and Phenomena · Terahertz technology and applications · Advanced Semiconductor Detectors and Materials
