The half-life of $^{221}$Fr in Si and Au at 4K and at mK temperatures
F. Wauters, B. Verstichel, M. Breitenfeldt, V. De Leebeeck, V. Yu., Kozlov, I. Kraev, S. Roccia, G. Soti, M. Tandecki, E. Traykov, S. Van Gorp,, D. Z'akouck'y, and N. Severijns

TL;DR
This study measures the half-life of $^{221}$Fr in different solid-state environments at cryogenic temperatures, finding no significant variation and providing a new precise half-life value.
Contribution
It presents the first systematic measurement of $^{221}$Fr half-life in Si and Au at mK and 4K temperatures, confirming environmental independence and refining the half-life value.
Findings
No half-life variation within 0.1% across environments
New precise half-life value of 286.1(10) seconds
Environmental factors do not affect $^{221}$Fr alpha decay
Abstract
The half-life of the decaying nucleus Fr was determined in different environments, i.e. embedded in Si at 4 K, and embedded in Au at 4 K and about 20 mK. No differences in half-life for these different conditions were observed within 0.1%. Furthermore, we quote a new value for the absolute half-life of Fr of t = 286.1(10) s, which is of comparable precision to the most precise value available in literature.
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