TL;DR
This paper introduces an analytical method using flicker noise spectroscopy to parameterize nanosurface irregularities from AFM images, aiding in understanding and predicting corrosion resistance of coatings.
Contribution
The paper develops a novel analytical approach employing flicker noise spectroscopy to quantify nanoscale surface irregularities from AFM data, linking surface features to corrosion resistance.
Findings
Parameters of surface spikiness correlate with process temperature.
Surface irregularities influence corrosion resistance.
Method enables prediction of coating properties.
Abstract
The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the surface manufacturing process. Among these features, the surface irregularities and self-similarity structures at different spatial scales, especially in the range of 1 to 100 nm, are of high importance because they greatly affect the surface interaction forces acting at a nanoscale distance. An analytical method for parameterizing the surface irregularities and their correlations in nanosurfaces imaged by atomic force microscopy (AFM) is proposed. In this method, flicker noise spectroscopy - a statistical physics approach - is used to develop six nanometrological parameters characterizing the high-frequency contributions of jump- and spike-like…
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