Sub-wavelength surface IR imaging of soft-condensed matter

TL;DR

This paper presents a novel sub-wavelength IR imaging technique combining a specialized laser and AFM to achieve 200 nm resolution for chemical and topographical surface mapping of soft matter.

Contribution

The paper introduces a new surface excitation illumination method enabling simultaneous chemical and topographical imaging with high resolution.

Findings

Achieved 200 nm spatial resolution in IR surface imaging.

Successfully demonstrated imaging of polystyrene micro-structures.

Combined chemical mapping with AFM topography in a single technique.

Abstract

Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.