Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements

TL;DR

This paper discusses how noncontact atomic force microscopy can help improve the accuracy of Casimir force measurements by addressing surface electric noise issues, fostering collaboration between different research communities.

Contribution

It proposes specific experimental tasks using AFM techniques to better understand surface effects impacting Casimir force measurements.

Findings

Surface electric noise affects precision force measurements.

AFM techniques can characterize surface charge distributions.

Collaborative experiments are crucial for accurate Casimir force data.

Abstract

Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is encountered in a number of different experimental circumstances. The scientists employing atomic force microscopy (AFM) have long focused their efforts to understand the surface-related noise issues via variants of AFM techniques, such as Kelvin probe force microscopy or electric force microscopy. Recently, the physicists investigating quantum vacuum fluctuation phenomena between two closely-spaced objects have also begun to collect experimental evidence indicating a presence of surface effects neglected in their previous analyses. It now appears that the two seemingly disparate science communities are encountering effects rooted in the same surface phenomena. In this report, we suggest specific experimental tasks to be performed in the near future that are crucial not only for fostering needed collaborations between the two communities, but also for providing valuable data on the surface effects in order to draw the most realistic conclusion about the actual contribution of the Casimir force (or van der Waals force) between a pair of real materials.