Spectroscopy of electron flows with single- and two-particle emitters
Michael Moskalets, Markus B\"uttiker

TL;DR
This paper introduces a spectroscopic method using correlation measurements at a quantum point contact to analyze and compare the states of electrons emitted from various sources, revealing differences in their quantum states and noise correlations.
Contribution
It proposes a novel correlation-based spectroscopic technique to distinguish electron states from different sources, including single-electron emitters and biased contacts, based on noise suppression patterns.
Findings
Noise correlation suppression indicates overlapping electron states.
Different electron sources produce distinct noise correlation signatures.
Applying quantized voltage pulses can suppress noise in multi-electron emissions.
Abstract
To analyze the state of injected carrier streams of different electron sources, we propose to use correlation measurements at a quantum point contact with the different sources connected via chiral edge states to the two inputs. In particular we consider the case of an on-demand single-electron emitter correlated with the carriers incident from a biased normal reservoir, a contact subject to an alternating voltage and a stochastic single electron emitter. The correlation can be viewed as a spectroscopic tool to compare the states of injected particles of different sources. If at the quantum point contact the amplitude profiles of electrons overlap, the noise correlation is suppressed. In the absence of an overlap the noise is roughly the sum of the noise powers due to the electron streams in each input. We show that the electron state emitted from a (dc or ac) biased metallic contact is…
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