Interaction of the Electromagnetic p-Waves with Thin Metal Films
A.V. Latyshev, A.A. Yushkanov
TL;DR
This paper provides an analytical solution for electromagnetic p-wave interactions with thin metal films, revealing how transmission, reflection, and absorption depend on various parameters.
Contribution
It introduces an analytical approach to analyze electromagnetic wave interactions with thin metallic films, considering arbitrary boundary conditions.
Findings
Transmission, reflection, and absorption coefficients depend on incidence angle and film thickness.
Analytical solutions are obtained for films thinner than the skin layer.
Dependence on the coefficient of specular reflection is characterized.
Abstract
For the first time it is shown that for thin metallic films thickness of which not exceed thickness of skin-layer, the problem allows analytical solution for arbitrary boundary value problems. The analysis of dependence of coefficients of transmission, reflection and absorbtion on angle incidence, thickness of films and coefficient of specular reflection is carried out.
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