Interaction of the Electromagnetic S-Wave with the Thin Metal Film
A. V. Latyshev, A. A. Yushkanov
TL;DR
This paper provides an analytical solution for electromagnetic wave interaction with thin metal films, analyzing transmission, reflection, and absorption based on various parameters.
Contribution
It offers a novel analytical approach to understanding electromagnetic interactions with thin metal films under different boundary conditions.
Findings
Analytical expressions for transmission, reflection, and absorption coefficients.
Dependence of coefficients on incidence angle, film thickness, and frequency.
Effect of boundary conditions on electromagnetic wave behavior.
Abstract
It is shown that for thin metal films, thickness of which does not exceed a thickness of a skin-layer, the problem allows analytical solution for any boundary conditions. The analysis of transmission, reflection and absorption of an electromagnetic wave coefficients depending on a angle of incidence, thickness of a layer, coefficient of specular reflection and frequency of oscillations of electromagnetic field is carried out.
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Taxonomy
TopicsCopper Interconnects and Reliability · Electronic Packaging and Soldering Technologies · Photonic Crystals and Applications