CMOS compatible dense arrays of Ge quantum dots on the Si(001) surface: Hut cluster nucleation, atomic structure, and array life cycle during UHV MBE growth
L. V. Arapkina, V. A. Yuryev

TL;DR
This study provides atomic-level insights into the nucleation, structure, and growth dynamics of Ge quantum dot arrays on Si(001) during UHV MBE, revealing distinct behaviors of pyramid and wedge huts and their evolution over coverage.
Contribution
It offers detailed atomic models of Ge hut nuclei and growth mechanisms, highlighting differences between pyramid and wedge structures and their impact on array evolution.
Findings
Wedge huts contain point defects at upper corners.
Pyramid growth occurs without phase transitions.
Wedge density increases with coverage, pyramids decrease.
Abstract
We report a direct observation of Ge hut nucleation on Si(001) during UHV MBE. The study was carried out using a UHV instrument coupling MBE chamber and STM which enables the sample study on atomic level at any stage of treatment. Si wafers were deoxidized by annealing at 925C. Ge was deposited by electron beam evaporation; the coverage was varied from 3 to 14 \AA; the wafer temperature was 360C. The nuclei of pyramids and wedges were observed on the (MxN) wetting layer (WL) patches and found to have different structures. The atomic models of nuclei of both hut species have been built as well as the models of the growing clusters. The growth of huts of each species has been demonstrated to follow generic scenarios. The formation of the second atomic layer of the wedge results in rearrangement of its first layer. Its ridge structure does not repeat the nucleus. The pyramid grows without…
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