Time resolved X-ray Resonant Magnetic Scattering in reflection geometry

TL;DR

This paper introduces a novel time-resolved, element-specific X-ray magnetic scattering setup in reflection geometry, achieving sub-100 ps resolution to study magnetization dynamics in thin films and multilayers.

Contribution

The work presents a new experimental setup combining time-resolved XRMS with reflection geometry and cryogenic capabilities for detailed magnetization dynamics studies.

Findings

Achieved sub-100 ps temporal resolution.

Enabled element-specific magnetization measurements.

Facilitated temperature-dependent magnetic damping studies.

Abstract

We present a new setup to measure element-selective magnetization dynamics using the ALICE chamber (RSI \textbf{74}, 4048 (2003)) at the BESSY II synchrotron at the Helmholtz-Zentrum Berlin. A magnetic field pulse serves as excitation, and the magnetization precession is probed by element selective X-ray Resonant Magnetic Scattering (XRMS). With the use of single bunch generated x-rays a temporal resolution well below 100 ps is reached. The setup is realized in reflection geometry and enables investigations of thin films described here, multilayers, and laterally structured samples. The combination of the time resolved setup with a cryostat in the ALICE chamber will allow to conduct temperature-dependent studies of precessional magnetization dynamics and of damping constants over a large temperature range and for a large variety of systems in reflection geometry.