Imaging ellipsometry of graphene
Ulrich Wurstbauer, Christian R\"oling, Ursula Wurstbauer, Werner, Wegscheider, Matthias Vaupel, Peter H. Thiesen, and Dieter Weiss
TL;DR
This paper demonstrates the use of imaging ellipsometry to detect, characterize, and analyze the optical properties of graphene on various substrates with high spatial resolution.
Contribution
It introduces imaging ellipsometry as an effective method for studying graphene's optical properties and substrate effects with high spatial resolution.
Findings
Imaging ellipsometry can detect graphene on flat substrates.
Optical constants of graphene can be explored using spectroscopic ellipsometry.
Substrate influence on graphene's optical properties can be investigated.
Abstract
Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way the influence of the substrate on graphene's optical properties can be investigated
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